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Issue DateTitle / Author(s) / CitationFileAltmetrics
2022-08

Jeong, Heejae; Kim, Y. S.; Baik, Seunghun; Kang, Hongki; Jang, Jae Eun; Kwon, Hyuk-Jun

IEEE Electron Device Letters, Vol.43 No.8, pp.1315-1318

DOI
1