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유기금속 화학기상 증착법으로 Si기판에 형성한 Hf-기반 게이트 유전막의 성장 및 특성향상에 관한 연구 : Study of growth and characteristics enhancement of Hf-based gate dielectrics deposited by metal organic chemical vapor deposition

DC Field Value Language
dc.contributor.advisor황철성-
dc.contributor.author이석우-
dc.date.accessioned2010-01-25T07:25:00Z-
dc.date.available2010-01-25T07:25:00Z-
dc.date.copyright2005.-
dc.date.issued2005-
dc.identifier.urihttp://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000050837kog
dc.identifier.urihttps://hdl.handle.net/10371/43556-
dc.description학위논문(석사)--서울대학교 대학원 :협동과정 나노과학기술전공,2005.ko
dc.format.extentxiii, 125 p.ko
dc.language.isokoko
dc.publisher서울대학교 대학원ko
dc.subjectHfO2ko
dc.subjectHf-silicateko
dc.subjectgate oxideko
dc.subjectCVDko
dc.title유기금속 화학기상 증착법으로 Si기판에 형성한 Hf-기반 게이트 유전막의 성장 및 특성향상에 관한 연구ko
dc.title.alternativeStudy of growth and characteristics enhancement of Hf-based gate dielectrics deposited by metal organic chemical vapor depositionko
dc.typeThesis-
dc.contributor.department협동과정 나노과학기술전공-
dc.description.degreeMasterko
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