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Fast defect detection and classification of patterned thin film transistor-liquid crystal displays
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- Authors
- Advisor
- 박희재
- Issue Date
- 2006
- Publisher
- 서울대학교 대학원
- Keywords
- LCD ; LCD ; 결함 검사 ; Defect Inspection ; 영역 결합 ; Region Merging ; 경계 확장 ; Border Expansion ; 결함 분류 ; Defect Classification
- Description
- Thesis(master`s)--서울대학교 대학원 :기계항공공학부,2006.
- Language
- English
- URI
- http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000047535
https://hdl.handle.net/10371/44469
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