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Modeling of semiconductor device noise using the impedance field method : Impedance field method를 이용한 반도체 소자 잡음 모델링
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- Authors
- Advisor
- 박영준
- Issue Date
- 2003
- Publisher
- 서울대학교 대학원
- Keywords
- 잡음 ; Noise ; flicker ; Flicker ; 1/f ; $1/f$ ; impedance field method ; Impedance field method ; 잡음 계산 ; Noise calculation ; MOSFET ; Mosfet ; 반도체 소자 ; Semiconductor devices ; characteristic potential method ; Characteristic potential method
- Description
- Thesis (doctoral)--서울대학교 대학원 :전기·컴퓨터공학부,2003.
- Language
- English
- URI
- http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000059540
https://hdl.handle.net/10371/45872
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