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Heteroepitaxal fabrication and structural characterization of ultrafine GaN/ZnO coaxial nanorod heterostructures

DC Field Value Language
dc.contributor.authorAn, Sung Jin-
dc.contributor.authorPark, Won Il-
dc.contributor.authorYi, Gyu-Chul-
dc.contributor.authorKim, Yong-Jin-
dc.contributor.authorKang, Hee-Bok-
dc.contributor.authorKim, Miyoung-
dc.date.accessioned2009-06-23T05:46:39Z-
dc.date.available2009-06-23T05:46:39Z-
dc.date.issued2004-05-03-
dc.identifier.citationAppl. Phys. Lett. 84, 3612 (2004)en
dc.identifier.issn0003-6951 (print)-
dc.identifier.issn1077-3118 (online)-
dc.identifier.urihttps://hdl.handle.net/10371/4883-
dc.identifier.urihttp://link.aip.org/link/?APPLAB/84/3612/1-
dc.description.abstractWe report on heteroepitaxial fabrication and structural characterizations of ultrafine GaN/ZnO coaxial nanorod heterostructures. The coaxial nanorod heterostructures were fabricated by epitaxial growth of a GaN layer on ultrafine ZnO nanorods. Epitaxial growth and precise control of GaN overlayer thickness were obtained by low pressure metalorganic vapor-phase epitaxy. ZnO nanorods grown on Si and sapphire substrates using catalyst-free metalorganic chemical vapor deposition exhibited diameters as small as 7 nm. Furthermore, structural properties of the coaxial nanorod heterostructures were investigated using both synchrotron-radiation x-ray diffraction and high resolution transmission electron microscopy. (C) 2004 American Institute of Physics.en
dc.language.isoenen
dc.publisherAmerican Institute of Physicsen
dc.subjectCORE-SHELLen
dc.subjectNITRIDEen
dc.subjectGROWTHen
dc.subjectGANen
dc.titleHeteroepitaxal fabrication and structural characterization of ultrafine GaN/ZnO coaxial nanorod heterostructuresen
dc.typeArticleen
dc.contributor.AlternativeAuthor이규철-
dc.contributor.AlternativeAuthor안성진-
dc.contributor.AlternativeAuthor박원일-
dc.contributor.AlternativeAuthor김용진-
dc.contributor.AlternativeAuthor강희복-
dc.contributor.AlternativeAuthor김미영-
dc.identifier.doi10.1063/1.1738180-
dc.identifier.doi10.1063/1.1738180-
dc.citation.journaltitleApplied Physics Letters-
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