Thickness dependence of the melting temperature in thin polymer films

Abstract

The melting temperature (Tm) of thin poly[ethylene-co-(vinyl acetate)] films coated on a silicon wafer was investigated. Ellipsometry was used to measure the Tm which was found to decrease dramatically when the thickness of the film is less than 300 A° . The relationship between the lamellar thickness and the Tm was thought to be responsible this thickness dependence of the Tm in thin polymer films.