Thickness dependence of the melting temperature in thin polymer films
- Jang, Jyongsik; Kim, Jae Hyun; Zin, Wang-Cheol
- Issue Date
- Macromol. Rapid Commun. 2001, 22, 386
- The melting temperature (Tm) of thin
poly[ethylene-co-(vinyl acetate)] films coated on a silicon
wafer was investigated. Ellipsometry was used to measure
the Tm which was found to decrease dramatically when
the thickness of the film is less than 300 A°
. The relationship
between the lamellar thickness and the Tm was
thought to be responsible this thickness dependence of the
Tm in thin polymer films.
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