Browse

인간의 인지 능력에 기반한 LCD 영역형 얼룩의 불량 수준 측정

Cited 0 time in Web of Science Cited 0 time in Scopus
Authors
이원희
Advisor
유석인
Issue Date
2007
Publisher
서울대학교 대학원
Keywords
TFT-LCDTFT-LCDMURAMURA수치화Quantification비전Vision검사Inspection불량DefectJNDJND영역형 얼룩
Description
학위논문(석사) --서울대학교 대학원 :전기. 컴퓨터공학부,2007.
Language
Korean
URI
http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000043942

https://hdl.handle.net/10371/50119
Files in This Item:
There are no files associated with this item.
Appears in Collections:
College of Engineering/Engineering Practice School (공과대학/대학원)Dept. of Electrical and Computer Engineering (전기·정보공학부)Theses (Master's Degree_전기·정보공학부)
  • mendeley

Items in S-Space are protected by copyright, with all rights reserved, unless otherwise indicated.

Browse