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Detailed Information
Study on RTS noise of the nano-scale MOSFET and its application to CMOS image sensor readout circuit : MOSFET의 RTS 노이즈 연구와 CMOS image sensor readout 회로에의 적용
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- Authors
- Advisor
- 신형철
- Issue Date
- 2007
- Publisher
- 서울대학교 대학원
- Keywords
- 저주파 노이즈 ; CMOS Image Sensor ; 이미지 센서 ; Random Telegraph Signal Noise ; 전계효과트랜지스터 ; Oxide trap ; Time constants ; Location of trap ; FN-stress ; Dual oxide device ; Single oxide device
- Description
- Thesis(master`s)--서울대학교 대학원 :전기·컴퓨터공학부,2007.
- Language
- English
- URI
- http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000045807
https://hdl.handle.net/10371/53516
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