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Estimation of the Thickness Dependence of the Glass Transition Temperature in Various Thin Polymer Films

Cited 155 time in Web of Science Cited 161 time in Scopus
Authors
Kim, Jae Hyun; Jang, Jyongsik; Zin, Wang-Cheol
Issue Date
2000
Publisher
American Chemical Society
Citation
Langmuir 2000, 16, 4064-4067
Abstract
The glass transition temperature (Tg) in the thin poly(R-methyl styrene) and polysufone films that are
coated on the surface of a Si wafer is investigated in this paper. A novel equation was suggested to estimate
the thickness dependence of Tg in thin films. Ellipsometry has been used to measure Tg of various thin
films as functions of sample thickness, molecular weight, and kind of polymer. One adjustable parameter
in the equation, i.e., ê, was obtained from fitting this function with the experimentally measured Tg. The
magnitude of the fitted parameter ê showed discrepancies between the polymer types but similarity between
the molecular weights. This parameter ê corresponded to the statistical segment length of the polymer.
All the measured Tg data of the investigated polymers were superimposed in one curve by normalizing
the thickness and the measured Tg with the parameter ê and bulk Tg, respectively. The origin of Tg
depression phenomena in thin films was closely correlated with its segmental length and not with whole
chain size.
ISSN
0743-7463
Language
English
URI
https://hdl.handle.net/10371/61967
DOI
https://doi.org/10.1021/la991618t
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College of Engineering/Engineering Practice School (공과대학/대학원)Dept. of Chemical and Biological Engineering (화학생물공학부)Journal Papers (저널논문_화학생물공학부)
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