Browse

Optimized Surface Pretreatments for Copper Electroplating

DC Field Value Language
dc.contributor.authorKim, Jae Jeong-
dc.contributor.authorKim, Soo-Kil-
dc.date.accessioned2010-04-15T07:13:59Z-
dc.date.available2010-04-15T07:13:59Z-
dc.date.issued2001-12-
dc.identifier.citationApplied Surface Science 183 (2001) 311-318en
dc.identifier.issn0021-4922-
dc.identifier.urihttps://hdl.handle.net/10371/63260-
dc.description.abstractWe investigated the ability of conventional pretreatment systems to eliminate the surface native oxide from copper sputter-coated TiN/Si (1 0 0) prior to copper electroplating. The cuprous oxide on copper seed layers was removed by surface pretreatment processes, which resulted in uniform and smooth electroplated copper. Sheet resistance measurements and AFM analysis revealed that both the wet cleaning method, using 1:200 NH4OH solution, and the coulometric reduction method were effective at removing the copper native oxide, which are mainly cuprous oxide on a (2 0 0) copper seed layer. In particular, the coulometric reduction method offers an in situ pretreatment process, which is self-limiting in terms of etch. Copper films electroplated on such pretreated seed layers were thicker, smoother and had finer grains than those formed on artificial copper oxide layers.en
dc.language.isoen-
dc.publisherElsevieren
dc.subjectcopperen
dc.subjectOxideen
dc.subjectPretreatmenten
dc.subjectCoulometricen
dc.subjectreductionen
dc.subjectWet cleaningen
dc.subjectElectroplatingen
dc.titleOptimized Surface Pretreatments for Copper Electroplatingen
dc.typeArticleen
dc.contributor.AlternativeAuthor김재정-
dc.contributor.AlternativeAuthor김수길-
dc.identifier.doi10.1016/S0169-4332(01)00585-2-
Appears in Collections:
College of Engineering/Engineering Practice School (공과대학/대학원)Dept. of Chemical and Biological Engineering (화학생물공학부)Journal Papers (저널논문_화학생물공학부)
Files in This Item:
There are no files associated with this item.
  • mendeley

Items in S-Space are protected by copyright, with all rights reserved, unless otherwise indicated.

Browse