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The Inhibition of Silver Agglomeration by Gold Activation in Silver Electroless Plating

DC Field Value Language
dc.contributor.authorCha, Seung Hwan-
dc.contributor.authorKoo, Hyo-Chol-
dc.contributor.authorKim, Jae Jeong-
dc.date.accessioned2010-05-14T05:26:42Z-
dc.date.available2010-05-14T05:26:42Z-
dc.date.issued2005-05-05-
dc.identifier.citationJournal of The Electrochemical Society, 152 (6), C388-C391en
dc.identifier.issn0013-4651-
dc.identifier.urihttps://hdl.handle.net/10371/66123-
dc.description.abstractIn Ag electroless plating, Ag agglomeration has been the obstacle to obtain thin Ag films. The crystallographic misfit between the
substrate and Ag can accelerate Ag agglomeration. In this paper, Au, whose crystallographic characteristics are similar with those
of Ag, is used as the activation material. As a result, the Ag layer was deposited in the form of layer-by-layer growth. Therefore,
Ag film electrolessly deposited on a substrate activated by Au can be used to manufacture the interconnections in microelectronic
devices. In this experiment, the resistivity of the Ag film was measured to 2.5 mV cm, which was decreased to 1.95 mV cm by the
annealing process.
en
dc.language.isoenen
dc.publisherElectrochemical Societyen
dc.subjectsilveren
dc.subjectgolden
dc.subjectelectroless depositionen
dc.subjectmetallic thin filmsen
dc.subjectelectrical resistivityen
dc.subjectannealingen
dc.titleThe Inhibition of Silver Agglomeration by Gold Activation in Silver Electroless Platingen
dc.typeArticleen
dc.contributor.AlternativeAuthor차승환-
dc.contributor.AlternativeAuthor구효철-
dc.contributor.AlternativeAuthor김재정-
dc.identifier.doi10.1149/1.1905984-
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