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Electrochemical porosimetry: Deconvolution of distribution functions

DC Field Value Language
dc.contributor.authorSong, Hyun-Kon-
dc.contributor.authorJang, Jong H-
dc.contributor.authorKim, Jae Jeong-
dc.contributor.authorOh, Seung M-
dc.date.accessioned2010-07-05T05:44:31Z-
dc.date.available2010-07-05T05:44:31Z-
dc.date.issued2006-06-30-
dc.identifier.citationElectrochemistry Communications, 8 (2006) 1191–1196en
dc.identifier.issn1388-2481-
dc.identifier.urihttps://hdl.handle.net/10371/68282-
dc.description.abstractDiscrete Fourier transform (DFT) was used to deconvolute the distribution of penetrability coefficient (ao-distribution, equivalent to
pore size distribution) from electrochemical impedance data of porous electrodes. The working equation is the Fredholm integral equation
of the first kind to correlate macroscopic impedance data to a theoretical model describing microscopic signal with the ao-distribution.
Simulated and experimental impedance data were tested. Noise observed at high frequencies in Fourier space was removed before
inversely Fourier-transforming the ao-distribution from Fourier space to real space. The accuracy of ao-distributions deconvoluted by
DFT depended on the number, frequency range and quality of impedance data. The examples in this work showed that fairly accurate
ao-distributions could be obtained by DFT deconvolution. Most promising method was to use the ao-distribution obtained from DFT
deconvolution as the first guess to shape the true ao-distribution. Then, accurate ao-distributions could be obtained by estimating parameters
of the pre-assumed distributions by using complex nonlinear least square fitting.
en
dc.description.sponsorshipThis work was supported by KOSEF via the Research
Center for Energy Conversion and Storage.
en
dc.language.isoenen
dc.publisherElsevieren
dc.subjectDeconvolutionen
dc.subjectFourier transformen
dc.subjectImpedanceen
dc.subjectDistribution functionen
dc.subjectLow-pass filteringen
dc.titleElectrochemical porosimetry: Deconvolution of distribution functionsen
dc.typeArticleen
dc.contributor.AlternativeAuthor송현곤-
dc.contributor.AlternativeAuthor장종현-
dc.contributor.AlternativeAuthor김재정-
dc.contributor.AlternativeAuthor오승모-
dc.identifier.doi10.1016/j.elecom.2006.05.012-
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