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Constrained-Random Bitstream Generation for H.264/AVC Decoder Conformance Test

Cited 5 time in Web of Science Cited 6 time in Scopus
Issue Date
2010-05
Publisher
Institute of Electrical and Electronics Engineers
Citation
IEEE TRANSACTIONS ON CONSUMER ELECTRONICS, Vol.56, No.2, pp.848-855
Keywords
H.264/AVC decoder conformance testVideo test bitstreamConstrained-random bitstream
Abstract
We propose a novel method of video test bitstream for the H.264/AVC decoder conformance test without using input image sequences. Although the bitstreams can be generated from encoding the natural or artificial image sequences by a reference video encoder, their function coverage is not high enough because strong spatial and temporal correlations exist in the pixels and video parameters. The proposed method employs the constrained-random techniques to produce highly randomized video parameters in its bitstream. According to the experimental results, it substantially improves the function coverage and reduces the test time compared to those of normative conformance test bitstreams. Moreover, we can also generate the arbitrary bitstreams for stress test with the extreme values in the allowable ranges of the decoder parameters.
ISSN
0098-3063
Language
English
URI
https://hdl.handle.net/10371/81153
DOI
https://doi.org/10.1109/TCE.2010.5506011
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College of Engineering/Engineering Practice School (공과대학/대학원)Dept. of Electrical and Computer Engineering (전기·정보공학부)Journal Papers (저널논문_전기·정보공학부)
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