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Issue Date | Title / Author(s) / Citation | File | Altmetrics |
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2022-06 | STEM Image Analysis Based on Deep Learning: Identification of Vacancy Defects and Polymorphs of MoS2 Nano Letters, Vol.22 No.12, pp.4677-4685 | DOI | |
2023-08 | Journal of Intelligent Manufacturing, Vol.34 No.6, pp.2729-2745 | DOI |
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