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Issue Date | Title / Author(s) / Citation | File | Altmetrics |
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2003 | link | ||
2006 | link | ||
2007 | link | ||
2007 | (A)Study of artifacts generated during TEM sample preparation using Ion Milling and focused lon Beam | link | |
2012-11 | Small, Vol.8 No.21, pp.3263-3268 | DOI | |
2017-02 | view file | ||
2021 | view filelink | ||
2021-02 | view filelink |
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