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Issue Date	Title / Author(s) / Citation	File
2015-11	Fluorinated CYTOP passivation effects on the electrical reliability of multilayer MoS2 field-effect transistors Roh, Jeongkyun; Cho, In-Tak; Shin, Hyeonwoo; Baek, Geun Woo; Hong, Byung Hee; Lee, Jong-Ho; Jin, Sung Hun; Lee, Changhee Nanotechnology, Vol.26 No.45, p. 455201	DOI
2017-05	Thickness-dependent Schottky barrier height of MoS2 field-effect transistors Kwon, Junyoung; Lee, Jong-Young; Yu, Young-Jun; Lee, Chul-Ho; Cui, Xu; Honed, James; Lee, Gwan-Hyoung Nanoscale, Vol.9 No.18, pp.6151-6157	DOI
2019-03	Enhanced Charge Injection Properties of Organic Field-Effect Transistor by Molecular Implantation Doping Kim, Youngrok; Chung, Seungjun; Cho, Kyungjune; Harkin, David; Hwang, Wang-Taek; Yoo, Daekyoung; Kim, Jae-Keun; Lee, Woocheol; Song, Younggul; Ahn, Heebeom; Hong, Yongtaek; Sirringhaus, Henning; Kang, Keehoon; Lee, Takhee Advanced Materials, Vol.31 No.10, p. 1806697	DOI
2020-08	Effects of lithium doping and ultraviolet photo-patterning on electrical properties of InGaZnO thin film transistors Jang, Jongsu; Hong, Yongtaek Thin Solid Films, Vol.707, p. 138098	DOI