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Thickness and temperature dependency of variation of dielectric functions of phase-change VO2 film
Cited 1 time in
Web of Science
Cited 0 time in Scopus
- Authors
- Issue Date
- 2018-07
- Publisher
- IEEE
- Citation
- 23RD OPTO-ELECTRONICS AND COMMUNICATIONS CONFERENCE (OECC2018)
- Abstract
- In this paper, temperature-and thickness-dependent variation of dielectric functions of VO2 film deposited by pulsed-laser deposition is characterized at both insulating and metallic phases by ellipsometry.
- ISSN
- 2166-8884
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