A Fully Integrated 700mA Event-Driven Digital Low-Dropout Regulator with Residue-Tracking Loop for Fine-Grained Power Management Unit

Abstract

This paper presents a fully integrated digital low-dropout regulator (LDO). A proposed event-driven digital control based on a residue-tracking loop provides not only a heavy load capacity of 700mA but also an accurate regulation. A latch-based shift register is adopted to improve the digital regulation against a large load current change. The proposed LDO embedding an on-chip 100pF output capacitor was fabricated in a 65nm LP CMOS process. The LDO provides a load regulation of 0.1mV/mA and an output voltage error below 1.1% across a range from 0.5 to 1V. The LDO achieves a figure-of-merit (FOM) of 6.74fs.