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Issue Date	Title / Author(s) / Citation	File
2002-02	Electromigration-induced via failure assisted by neighboring clusters Choi, In Suk; Park, YJ; Joo, YC SCRIPTA MATERIALIA, Vol.46 No.3, pp.247-251	DOI
2013-08	High temperature low cycle fatigue properties of 24Cr ferritic stainless steel for SOFC applications Kim, Byung Kyu; Kim, Dong Ik; Choi, In Suk; Jung, Woo Sang; Kwun, Sook In Materials Science and Engineering: A, Vol.577, pp.81-86	DOI
2017-10	Preferred diffusion paths for copper electromigration by in situ transmission electron microscopy Oh, Young-Hwa; Kim, Sung-Il; Kim, Miyoung; Lee, Seung-Yong; Kim, Young-Woon Ultramicroscopy, Vol.181, pp.160-164	DOI