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Browsing by Author Koo, Ryun-Han

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Showing results 1 to 3 of 3

Issue Date Title / Author(s) / CitationFileAltmetrics
2022-06
Investigation of Low-Frequency Noise Characteristics of Ferroelectric Tunnel Junction: From Conduction Mechanism and Scaling Perspectives

Shin, Wonjun; Bae, Jong-Ho; Kwon, Dongseok; Koo, Ryun-Han; Park, Byung-Gook; Kwon, Daewoong; Lee, Jong-Ho

IEEE Electron Device Letters, Vol.43 No.6, pp.958-961

DOI
2022-07
Highly Efficient Self-Curing Method in MOSFET Using Parasitic Bipolar Junction Transistor

Shin, Wonjun; Koo, Ryun-Han; Hong, Seongbin; Kwon, Dongseok; Hwang, Joon; Park, Byung-Gook; Lee, Jong-Ho

IEEE Electron Device Letters, Vol.43 No.7, pp.1001-1004

DOI
2023-02
Recovery of off-state stress-induced damage in FET-type gas sensor using self-curing method
view fileDOI
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