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Issue Date	Title / Author(s) / Citation	File
2022-06	Investigation of Low-Frequency Noise Characteristics of Ferroelectric Tunnel Junction: From Conduction Mechanism and Scaling Perspectives Shin, Wonjun; Bae, Jong-Ho; Kwon, Dongseok; Koo, Ryun-Han; Park, Byung-Gook; Kwon, Daewoong; Lee, Jong-Ho IEEE Electron Device Letters, Vol.43 No.6, pp.958-961	DOI
2022-07	Highly Efficient Self-Curing Method in MOSFET Using Parasitic Bipolar Junction Transistor Shin, Wonjun; Koo, Ryun-Han; Hong, Seongbin; Kwon, Dongseok; Hwang, Joon; Park, Byung-Gook; Lee, Jong-Ho IEEE Electron Device Letters, Vol.43 No.7, pp.1001-1004	DOI
2023-02	Recovery of off-state stress-induced damage in FET-type gas sensor using self-curing method Shin, Wonjun; Jeong, Yujeong; Kim, Mingyu; Lee, Jungsoo; Koo, Ryun-Han; Hong, Seongbin; Jung, Gyuweon; Kim, Jae-Joon; Lee, Jong-Ho Discover Nano, 18(1):24	view file DOI