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Issue Date | Title / Author(s) / Citation | File | Altmetrics |
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2017-02 | IEEE Electron Device Letters, Vol.38 No.2, pp.164-167 | DOI | |
2017-09 | IEEE Electron Device Letters, Vol.38 No.9, pp.1317-1320 | DOI | |
2018-09 | IEEE Transactions on Electron Devices, Vol.65 No.9, pp.3780-3785 | DOI | |
2019-04 | IEEE Transactions on Electron Devices, Vol.66 No.4, pp.2040-2043 | DOI | |
2019-10 | Journal of Nanoscience and Nanotechnology, Vol.19 No.10, pp.6123-6127 | DOI | |
2020-08 | IEEE Electron Device Letters, Vol.41 No.8, pp.1257-1260 | DOI | |
2021-01 | Solid-State Electronics, Vol.175, p. 107956 | DOI | |
2022-01 | IEEE Electron Device Letters, Vol.43 No.1, pp.162-165 | DOI | |
2022-02 | Electronics (Basel), Vol.11 No.3, p. 481 | DOI | |
2022-06 | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, Vol.22 No.3, pp.188-197 | DOI | |
2022-09 | IEEE Electron Device Letters, Vol.43 No.9, pp.1432-1435 | DOI |
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