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Showing results 941 to 960 of 7,407

Issue Date	Title / Author(s) / Citation	File
2007	Analysis of programming energy consumption in MLC (multi-level cell) flash memories 신동화	link
2005	Analysis of quasi-cyclic low-density parity-check codes and protograph codes 김성환	link
2013-08	Analysis of Random Telegraph Noise after Soft Breakdown in the Gate Induced Drain Leakage Current 이슬기	view file
2019-08	Analysis of Random Telegraph Noise Characteristics in Memory Devices (SRAM, DRAM, Flash) 서영수	view file link
2016-02	Analysis of Reliability Issues and Lifetime Estimation in NAND Flash Memory 이경환	view file
2009	Analysis of RTS Noise and Cell Characteristics in Flash Memory Having Floating-Gate 강대웅	link
2019-03	Analysis of Self Heating Effect in Vertical-channel Field Effect Transistor Myeong, Ilho; Jeon, Jongwook; Kang, Myounggon; Shin, Hyungcheol 2019 20TH INTERNATIONAL CONFERENCE ON THERMAL, MECHANICAL AND MULTI-PHYSICS SIMULATION AND EXPERIMENTS IN MICROELECTRONICS AND MICROSYSTEMS (EUROSIME), p. 8724510	DOI
2020	Analysis of Self Heating Effects in Nanoplate FET and 3D NAND Flash Memory 김현석	view file link
2000	Analysis of start-up transition dynamics of TCP NewReno 주창희	link
2012-08	Analysis of stochastic bias in estimation of distribution genetic programming 김강일	view file
2020	Analysis of Stress and Recovery Characteristics of OFF-State Stress in 3 nm-node NPFET 유예지	view file link
2021-10	Analysis of Synchronous-Rectification Switch Control for Active Class-E Rectifier Noh, Gwangyol; Lim, Gyu Cheol; Ha, Jung-Ik 2021 IEEE ENERGY CONVERSION CONGRESS AND EXPOSITION (ECCE), pp.2059-2066	DOI
2009	Analysis of the back-off mechanism and enhancing fairness in IEEE 802.11 ad-hoc networks 김영집	link
1998-05	Analysis of the non-uniform samplings in sigma-delta modul ated signals Lee, Eelwan; Chae, Soo-Ik ISCAS '97	view file
2020-11	Analysis of Torque Control Stability of PMSM Sensorless Drives in Flux Weakening Region Yoo, Jiwon; Sul, Seung-Ki 2020 IEEE 9TH INTERNATIONAL POWER ELECTRONICS AND MOTION CONTROL CONFERENCE (IPEMC2020-ECCE ASIA), pp.1493-1498	DOI
2017-02	Analysis of Trapped Charge Migration at 3D NAND Flash Memory with Multi Level Operation 박상구	view file
2012-02	Analysis of Variable Retention Time Using Random Telegraph Noise Model in DRAM Cell 김희상	link
2016-02	Analysis on Characteristics and Trapping Mechanism of Trap Sites inside Dielectric or Drain Causing Random Telegraph Noise in Trap-Assisted Tunneling GIDL 유성원	view file
2011-08	Analysis on grid synchronization under faulty grid conditions Ravi Mohan Lal	link
2021-02	Analysis on Hot Carrier Degradation (HCD) Reliability in FinFET Devices 김종수	view file link

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