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Issue DateTitle / Author(s) / CitationFileAltmetrics
2011-02link
2019-08view filelink
2021-02view filelink
2021-06

Lee, Jongmin; Kim, Jang-Hyun; Oh, Hee-Seok

IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol.43 No.6, pp.2165-2171

DOI
2023view filelink
1