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Issue Date	Title / Author(s) / Citation	File	Altmetrics
2015-01	Low frequency noise characteristics in multilayer WSe2 field effect transistor Cho, In-Tak; Kim, Jong In; Hong, Yoonki; Roh, Jeongkyun; Shin, Hyeonwoo; Baek, Geun Woo; Lee, Changhee; Hong, Byung Hee; Jin, Sung Hun; Lee, Jong-Ho Applied Physics Letters, Vol.106 No.2, p. 023504	DOI
2015-06	Multi-terminal transport measurements of MoS2 using a van der Waals heterostructure device platform Cui, Xu; Lee, Gwan-Hyoung; Kim, Young Duck; Arefe, Ghidewon; Huang, Pinshane Y.; Lee, Chul-Ho; Chenet, Daniel A.; Zhang, Xian; Wang, Lei; Ye, Fan; Pizzocchero, Filippo; Jessen, Bjarke S.; Watanabe, Kenji; Taniguchi, Takashi; Muller, David A.; Low, Tony; Kim, Philip; Hone, James Nature Nanotechnology, Vol.10 No.6, pp.534-540	DOI
2016-07	Wafer-scale transferable molybdenum disulfide thin-film catalysts for photoelectrochemical hydrogen production Kwon, Ki Chang; Choi, Seokhoon; Hong, Kootak; Moon, Cheon Woo; Shim, Young-Seok; Kim, Do Hong; Kim, Taemin; Sohn, Woonbae; Jeon, Jong-Myeong; Lee, Chul-Ho; Nam, Ki Tae; Han, Seungwu; Kim, Soo Young; Jang, Ho Won Energy and Environmental Sciences, Vol.9 No.7, pp.2240-2248	DOI
2016-08	Elimination of the gate and drain bias stresses in I-V characteristics of WSe2 FETs by using dual channel pulse measurement Park, Jun-Mo; Cho, In-Tak; Kang, Won-Mook; Park, Byung-Gook; Lee, Jong-Ho Applied Physics Letters, Vol.109 No.5, p. 053503	DOI
2016-11	Two-Dimensional Semiconductor Optoelectronics Based on van der Waals Heterostructures Lee, Jae Yoon; Shin, Jun-Hwan; Lee, Gwan-Hyoung; Lee, Chul-Ho Nanomaterials, Vol.6 No.11, p. 193	DOI
2018-09	Photovoltaic Field-Effect Transistors Using a MoS2 and Organic Rubrene van der Waals Hybrid Park, Cheol-Joon; Park, Hyeon Jung; Lee, Jae Yoon; Kim, Jeongyong; Lee, Chul-Ho; Joo, Jinsoo ACS Applied Materials & Interfaces, Vol.10 No.35, pp.29848-29856	DOI
2021-01	Enhanced Photoluminescence of Multiple Two-Dimensional van der Waals Heterostructures Fabricated by Layer-by-Layer Oxidation of MoS2 Kang, Sojung; Kim, Yoon Seok; Jeong, Jae Hwan; Kwon, Junyoung; Kim, Jong Hun; Jung, Yeonjoon; Kim, Jong Chan; Kim, Bumho; Hyun, Sang; Huang, Pinshane Y.; Hone, James C.; Jeong, Hu Young; Park, Jin-Woo; Lee, Chul-Ho; Lee, Gwan-Hyoung ACS Applied Materials and Interfaces, Vol.13 No.1, pp.1245-1252	DOI
2021-09	The Schottky–Mott Rule Expanded for Two-Dimensional Semiconductors: Influence of Substrate Dielectric Screening Park, Soohyung; Schultz, Thorsten; Shin, Dongguen; Mutz, Niklas; Aljarb, Areej; Kang, Hee Seong; Lee, Chul-Ho; Li, Lain-Jong; Xu, Xiaomin; Tung, Vincent; List-Kratochvil, Emil J. W.; Blumstengel, Sylke; Amsalem, Patrick; Koch, Norbert ACS Nano, Vol.15 No.9, pp.14794-14803	DOI
2021-09	Remote modulation doping in van der Waals heterostructure transistors Lee, Donghun; Lee, Jea Jung; Kim, Yoon Seok; Kim, Yeon Ho; Kim, Jong Chan; Huh, Woong; Lee, Jaeho; Park, Sungmin; Jeong, Hu Young; Kim, Young Duck; Lee, Chul-Ho Nature Electronics, Vol.4 No.9, pp.664-670	DOI
2022-03	Visualizing Grain Statistics in MOCVD WSe2 through Four-Dimensional Scanning Transmission Electron Microscopy Londono-Calderon, Alejandra; Dhall, Rohan; Ophus, Colin; Schneider, Matthew; Wang, Yongqiang; Dervishi, Enkeleda; Kang, Hee Seong; Lee, Chul-Ho; Yoo, Jinkyoung; Pettes, Michael T. Nano Letters, Vol.22 No.6, pp.2578-2585	DOI

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