Browse

Author

Jump to a point in the index
Or type in a year
  • Sort by
  • In order
  • Results/Page
  • Authors/record

Showing results 1 to 18 of 18

Issue DateTitle / Author(s) / CitationFileAltmetrics
2017-03

Joo, Deokjin; Kim, Taewhan

Integration, the VLSI Journal, Vol.57, pp.52-61

DOI
2017-04

Kim, Juyeon; Kim, Taewhan

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol.36 No.4, pp.641-654

DOI
2017-06

Moon, Hyoungseok; Kim, Taewhan

Integration, the VLSI Journal, Vol.58, pp.125-133

DOI
2019-01

Park, Heechun; Kim, Taewhan

Integration, the VLSI Journal, Vol.64, pp.29-39

DOI
2019-08

Jo, Kyeongrok; Ahn, Seyong; Do, Jungho; Song, Taejoong; Kim, Taewhan; Choi, Kyumyung

IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol.27 No.8, pp.1933-1946

DOI
2019-09

Kim, Taehwan; Jeong, Kwangok; Kim, Taewhan; Choi, Kyumyung

2019 IEEE COMPUTER SOCIETY ANNUAL SYMPOSIUM ON VLSI (ISVLSI 2019), pp.147-152

DOI
2019-11

Hyun, Gyounghwan; Kim, Taewhan

2019 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD), p. 8942061

DOI
2019-11

Hyun, Gyounghwan; Kim, Taewhan

2019 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD), p. 8942064

DOI
2020-03

Ahn, Byungmin; Kim, Taewhan

PROCEEDINGS OF THE 2020 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE 2020), pp.73-78

DOI
2021

Jo, Kyeongrok; Kim, Taewhan

2021 IEEE 39TH INTERNATIONAL CONFERENCE ON COMPUTER DESIGN (ICCD 2021), pp.517-524

DOI
2021

Jeong, Jooyeon; Kim, Taewhan

2021 IEEE INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS (MWSCAS), pp.228-231

DOI
2021

Jeong, Eunsol; Park, Heechun; Jeong, Jooyeon; Kim, Taewhan

2021 IEEE INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS (MWSCAS), pp.232-235

DOI
2021-08

Kim, Suwan; Kim, Taewhan

Midwest Symposium on Circuits and Systems, pp.224-227

DOI
2022-03

Jeong, Eunsol; Park, Heechun; Kim, Taewhan

Proceedings -Design, Automation and Test in Europe, DATE, pp.933-938

DOI
2022-03

Kim, Suwan; Kim, Taewhan

PROCEEDINGS OF THE 2022 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE 2022), pp.778-783

DOI
2022-06

Kang, Jongsung; Kim, Taewhan

Journal of Computing Science and Engineering, Vol.16 No.2, pp.79-87

DOI
2022-06

Heo, Jeongwoo; Jeong, Kwangok; Choi, Jung Yun; Kim, Taewhan; Choi, Kyumyung

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol.41 No.6, pp.1929-1942

DOI
2022-09

Chung, Sehyeon; Kim, Taewhan

Integration, the VLSI Journal, Vol.86, pp.1-8

DOI
1