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Issue Date	Title / Author(s) / Citation	File
2014-10	On-State Resistance Instability of Programmed Antifuse Cells during Read Operation Han, Jae Hwan; Lee, Hyunjin; Kim, Wansoo; Yoon, Gyuhan; Choi, Woo Young JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, Vol.14 No.5, pp.503-507	DOI
2016-10	Influence of Electron and Hole Distribution on 2T SONOS Embedded NVM Choi, Woo Young; Kim, Da Som; Lee, Tae Ho; Kwon, Young Jun; Park, Sung-Kun; Yoon, Gyuhan JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, Vol.16 No.5, pp.624-629	DOI
2017-02	Drain-current Modeling of Sub-70-nm PMOSFETs Dependent on Hot- carrier Stress Bias Conditions Lim, In Eui; Jhon, Heesauk; Yoon, Gyuhan; Choi, Woo Young JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, Vol.17 No.1, pp.94-100	DOI
2018-04	On-current Modeling of 70-nm PMOSFETs Dependent on Hot-carrier Stress Bias Conditions Choi, Woo Young; Lim, In Eui; Jhon, Heesauk; Yoon, Gyuhan JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, Vol.18 No.2, pp.131-138	DOI
2019-04	Influence of Etch Profiles on the Leakage Current and Capacitance of 3-D DRAM Storage Capacitors Shin, Seongun; Yoon, Gyuhan; Choi, Woo Young JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, Vol.19 No.2, pp.208-213	DOI
2019-04	A Technology-Computer-Aided-Design-Based Reliability Prediction Model for DRAM Storage Capacitors Choi, Woo Young; Yoon, Gyuhan; Chung, Woo Young; Cho, Younghoon; Shin, Seongun; Ahn, Kwang Ho Micromachines, Vol.10 No.4, p. 256	DOI