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Issue Date | Title / Author(s) / Citation | File | Altmetrics |
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2001 | Kim, Jae Jeong; Cha, Seung Hwan Japanese Journal of Applied Physics 40 (2001) 7151-7155 | DOI | |
2002-11 | Kim, Jae Jeong; Cha, Seung Hwan Japanese Journal of Applied Physics 41 (2002) L1269-L1271 | DOI | |
2003-12 | Kim, Jae Jeong; Kim, Soo-Kil; Kim, Yong Shik Journal of the Electrochemical Society, 151, C97-C101 | view fileDOI | |
2004 | link | ||
2004-05 | Han, Hee; Kim, Jae Jeong; Yoon, Do Young Journal of Vacuum Science and Technology a Vacuum Surfaces and Films 22(4), 1120-1123 | DOI | |
2005 | link | ||
2005-03 | Lee, Chang Hwa; Kim, Jae Jeong Journal of Vacuum Science and Technology B Microelectronics and Nanometer Structures 23(2), 475-479 | DOI | |
2006 | link | ||
2006 | Angew. Chem. Int. Ed. 2006, 45, 7564 –7567 | DOI | |
2007 | link | ||
2007-02 | Piao, Yuanzhe; Jang, Youngjin; Shokouhimehr, Mohammadreza; Lee, In Su; Hyeon, Taeghwan Small, Vol.3 No.2, pp.255-260 | DOI | |
2008 | link | ||
2008 | link | ||
2008 | link | ||
2017-02 | view file | ||
2018-02 | view file |
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