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전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

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Issue Date	Title / Author(s) / Citation	File
2011-01	Influence of carbon towards improved lithium storage properties of Li2MnSiO4 cathodes Aravindan, V.; Karthikeyan, K.; Kang, K. S.; Yoon, W. S.; Kim, W. S.; Lee, Y. S. Journal of Materials Chemistry, Vol.21 No.8, pp.2470-2475	DOI
2022-09	Influence of Channel Hole Remaining Ratio on Hemi-Cylindrical Vertical NAND Flash Memory Chang, Jin Ho; Uhm, Ji Ho; Kwon, Hyug Su; Kwon, Eunmee; Choi, Woo Young IEEE Electron Device Letters, Vol.43 No.9, pp.1432-1435	DOI
2010	Influence of CN ion implantation on oxidation behavior of ferritic stainless steels(Crofer22APU) 홍승희	link
2000	Influence of Currents on Equilibrium Range Spectra of Wind Waves Suh, Kyung Doug; Oh, Sang Ho; Thurston, Sidney; Hashimoto, Noriaki Journal of Waterway, Port, Coastal and Ocean Engineering, 126(2): 79-87	view file DOI
2008-03	Influence of DC arc jets on flow fields analyzed by an integrated numerical model for a DC–RF hybrid plasma Seo, Jun Ho; Park, Jin Myung; Hong, Sang Hee Plasma Sources Science and Technology 17 025011	DOI
2019-12	Influence of Effective Water-to-Cement Ratios on Internal Damage and Salt Scaling of Concrete with Superabsorbent Polymer Kim, Minsoo; Kang, Sung-Hoon; Hong, Sung-Gul; Moon, Juhyuk Materials, Vol.12 No.23, p. 3863	DOI
2016-10	Influence of Electron and Hole Distribution on 2T SONOS Embedded NVM Choi, Woo Young; Kim, Da Som; Lee, Tae Ho; Kwon, Young Jun; Park, Sung-Kun; Yoon, Gyuhan JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, Vol.16 No.5, pp.624-629	DOI
2019-04	Influence of Etch Profiles on the Leakage Current and Capacitance of 3-D DRAM Storage Capacitors Shin, Seongun; Yoon, Gyuhan; Choi, Woo Young JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, Vol.19 No.2, pp.208-213	DOI
2014-11	Influence of Fringe Field on Nano-Electromechanical (NEM) Memory Cells Han, Boram; Song, Ji Yong; Choi, Woo Young IEEE Transactions on Nanotechnology, Vol.13 No.6, pp.1102-1106	DOI
2020-06	Influence of Gate to Drain Underlap on Negative Differencial Resistance in Ferroelectric FET Lee, Kitae; Kim, Sihyun; Park, Byung-Gook 2020 IEEE SILICON NANOELECTRONICS WORKSHOP (SNW), pp.95-96	DOI
2017-02	Influence of Intercell Trapped Charge on Vertical NAND Flash Memory Choi, Woo Young; Kwon, Hyug Su; Kim, Yong Jun; Lee, Byungin; Yoo, Hyunseung; Choi, Sangmoo; Cho, Gyu-Seog; Park, Sung-Kye IEEE Electron Device Letters, Vol.38 No.2, pp.164-167	DOI
2017-02	Influence of internal curing with superabsorbent polymer on properties of ultra-high performance concrete 강성훈	view file
2017-02	Influence of line-edge roughness on multiple-gate tunnel field-effect transistors Choi, Woo Young Japanese Journal of Applied Physics, Vol.56 No.4S, p. 04CD06	DOI
2004	Influence of magnetic field on 1f noise and thermal noise in multi-terminal homogeneous resistors and MOSFETs, and discrimination between the number fluctuation model and the mobility fluctuation model for 1f noise in semiconductor devices 김용석	link
2019-05	Influence of Mainshock-Aftershock Sequence Selection Techniques in Quantifying Seismic Response Nikhilbhai Shah, Prerakkumar; Raghunandan, Meera 13th International Conference on Applications of Statistics and Probability in Civil Engineering(ICASP13), Seoul, South Korea, May 26-30, 2019	view file DOI
2016-05	Influence of Number Fluctuation and Position Variation of Channel Dopants and Gate Metal Grains on Tunneling Field-Effect Transistors (TFETs) Choi, Kyoung Min; Kim, Seung Kyu; Choi, Woo Young Journal of Nanoscience and Nanotechnology, Vol.16 No.5, pp.5255-5258	DOI
2018-06	Influence of Paint Baking Process on the Fracture Initiation of an Al-Mg-Si Alloy Sheet Gwak, S.; Jang, I. J.; Lee, J.; Noh, W.; Lee, M. G.; Song, J. H.; Jeong, C. Y. NUMISHEET 2018: 11TH INTERNATIONAL CONFERENCE AND WORKSHOP ON NUMERICAL SIMULATION OF 3D SHEET METAL FORMING PROCESSES, Vol.1063, p. 012027	DOI
2003	Influence of piezoelectric active damper on the dynamic stability of structure under a thrust 김희원	link
2009	Influence of plasma-assisted organic layer etching on organic light emitting diodes performance 양지훈	link
2015-04	Influence of Preferred Gate Metal Grain Orientation on Tunneling FETs Choi, Kyoung Min; Lee, Won-Sok; Lee, Keun-Ho; Park, Young-Kwan; Choi, Woo Young IEEE Transactions on Electron Devices, Vol.62 No.4, pp.1353-1356	DOI

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