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Showing results 321 to 360 of 457
Issue Date | Title / Author(s) / Citation | File | Altmetrics |
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2019-12 | 2019 IEEE GLOBAL COMMUNICATIONS CONFERENCE (GLOBECOM), p. 9013583 | DOI | |
2019-12 | 2019 IEEE GLOBAL COMMUNICATIONS CONFERENCE (GLOBECOM), p. 9013764 | DOI | |
2019-12 | 2019 IEEE GLOBAL COMMUNICATIONS CONFERENCE (GLOBECOM), p. 9013337 | DOI | |
2019-12 | 2019 IEEE GLOBAL COMMUNICATIONS CONFERENCE (GLOBECOM), p. 9013624 | DOI | |
2019-12 | PROCEEDINGS OF THE 2019 IEEE ASIA-PACIFIC MICROWAVE CONFERENCE (APMC), pp.1271-1273 | DOI | |
2019-12 | 2019 IEEE 58TH CONFERENCE ON DECISION AND CONTROL (CDC), pp.5362-5367 | DOI | |
2019-12 | 2019 IEEE 58TH CONFERENCE ON DECISION AND CONTROL (CDC), pp.7190-7195 | DOI | |
2020 | 2020 17TH INTERNATIONAL SOC DESIGN CONFERENCE (ISOCC 2020), pp.207-208 | DOI | |
2020 | 2020 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION AND TEST (VLSI-DAT) | ||
2020 | IEEE INFOCOM 2020 - IEEE CONFERENCE ON COMPUTER COMMUNICATIONS, Vol.2020-July, pp.69-78 | DOI | |
2020 | 2020 IEEE SYMPOSIUM ON VLSI CIRCUITS, Vol.2020-June | DOI | |
2020 | 2020 IEEE 20TH TOPICAL MEETING ON SILICON MONOLITHIC INTEGRATED CIRCUITS IN RF SYSTEMS (SIRF), pp.22-25 | DOI | |
2020 | 2020 IEEE ASIAN SOLID-STATE CIRCUITS CONFERENCE (A-SSCC) | DOI | |
2020 | IEEE International Symposium on Circuits and Systems proceedings, p. 9180728 | DOI | |
2020 | 2020 IEEE INTERNATIONAL SOLID- STATE CIRCUITS CONFERENCE (ISSCC), pp.270-+ | ||
2020 | 2020 IEEE INTERNATIONAL SOLID- STATE CIRCUITS CONFERENCE (ISSCC), pp.280-+ | ||
2020 | 2020 IEEE INTERNATIONAL SOLID- STATE CIRCUITS CONFERENCE (ISSCC), pp.266-+ | ||
2020 | PROCEEDINGS OF THE 2020 57TH ACM/EDAC/IEEE DESIGN AUTOMATION CONFERENCE (DAC) | ||
2020-01 | 2020 IEEE INTERNATIONAL CONFERENCE ON CONSUMER ELECTRONICS (ICCE), pp.522-527 | DOI | |
2020-02 | 2020 IEEE INTERNATIONAL SOLID- STATE CIRCUITS CONFERENCE (ISSCC), pp.340-342 | DOI | |
2020-03 | PROCEEDINGS OF THE 2020 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE 2020), pp.73-78 | DOI | |
2020-03 | PROCEEDINGS OF THE 2020 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE 2020), pp.858-863 | DOI | |
2020-04 | 2020 IEEE ELECTRON DEVICES TECHNOLOGY AND MANUFACTURING CONFERENCE (EDTM 2020), p. 9117879 | DOI | |
2020-04 | 2020 IEEE WIRELESS COMMUNICATIONS AND NETWORKING CONFERENCE WORKSHOPS (WCNCW), p. 9124800 | DOI | |
2020-04 | 2020 IEEE ELECTRON DEVICES TECHNOLOGY AND MANUFACTURING CONFERENCE (EDTM 2020), p. 9117940 | DOI | |
2020-04 | 2020 IEEE ELECTRON DEVICES TECHNOLOGY AND MANUFACTURING CONFERENCE (EDTM 2020), p. 9117961 | DOI | |
2020-04 | Methodology to Predict Random Telegraph Noise Induced Threshold Voltage Shift Using Machine Learning 2020 IEEE ELECTRON DEVICES TECHNOLOGY AND MANUFACTURING CONFERENCE (EDTM 2020), p. 9117805 | DOI | |
2020-05 | 2020 IEEE INTERNATIONAL CONFERENCE ON ACOUSTICS, SPEECH, AND SIGNAL PROCESSING, pp.7409-7413 | DOI | |
2020-05 | 2020 IEEE INTERNATIONAL CONFERENCE ON ACOUSTICS, SPEECH, AND SIGNAL PROCESSING, pp.3802-3806 | DOI | |
2020-05 | 2020 IEEE WIRELESS COMMUNICATIONS AND NETWORKING CONFERENCE (WCNC), p. 9120763 | DOI | |
2020-05 | 2020 IEEE WIRELESS COMMUNICATIONS AND NETWORKING CONFERENCE (WCNC), p. 9120723 | DOI | |
2020-05 | PROCEEDINGS OF THE 21ST IEEE INTERNATIONAL WORKSHOP ON SIGNAL PROCESSING ADVANCES IN WIRELESS COMMUNICATIONS (IEEE SPAWC2020), p. 9154261 | DOI | |
2020-05 | 2020 IEEE INTERNATIONAL CONFERENCE ON ACOUSTICS, SPEECH, AND SIGNAL PROCESSING, pp.3427-3431 | DOI | |
2020-05 | 2020 IEEE INTERNATIONAL CONFERENCE ON ROBOTICS AND AUTOMATION (ICRA), pp.8623-8629 | DOI | |
2020-05 | 2020 IEEE INTERNATIONAL CONFERENCE ON ROBOTICS AND AUTOMATION (ICRA), pp.4892-4898 | DOI | |
2020-06 | ICC 2020 - 2020 IEEE INTERNATIONAL CONFERENCE ON COMMUNICATIONS (ICC), p. 9149252 | DOI | |
2020-06 | 2020 IEEE SYMPOSIUM ON VLSI TECHNOLOGY, p. 9265089 | DOI | |
2020-06 | 2020 IEEE SILICON NANOELECTRONICS WORKSHOP (SNW), pp.99-100 | DOI | |
2020-06 | 2020 IEEE INTERNATIONAL SYMPOSIUM ON INFORMATION THEORY (ISIT), pp.1385-1390 | DOI | |
2020-06 | 2020 IEEE SILICON NANOELECTRONICS WORKSHOP (SNW), pp.95-96 | DOI |