Author
Showing results 1 to 39 of 39
Issue Date | Title / Author(s) / Citation | File | Altmetrics |
---|---|---|---|
2016-04 | IEEE Transactions on Electron Devices, Vol.63 No.4, pp.1533-1538 | DOI | |
2016-07 | Nanoscience and Nanotechnology Letters, Vol.8 No.7, pp.577-580 | DOI | |
2016-08 | Journal of the Korean Physical Society, Vol.69 No.3, pp.323-327 | DOI | |
2016-08 | Applied Physics Express, Vol.9 No.8, pp.084201-084201 | DOI | |
2016-08 | Applied Physics Letters, Vol.109 No.5, p. 053503 | DOI | |
2016-09 | IEEE Transactions on Electron Devices, Vol.63 No.9, pp.3521-3526 | DOI | |
2018-08 | Nanoscale Research Letters, 13(1):252 | view fileDOI | |
2019-06 | 2019 SILICON NANOELECTRONICS WORKSHOP (SNW), pp.69-70 | DOI | |
2019-06 | 2019 SILICON NANOELECTRONICS WORKSHOP (SNW), pp.81-82 | DOI | |
2019-06 | 2019 SILICON NANOELECTRONICS WORKSHOP (SNW), pp.51-52 | DOI | |
2019-06 | 2019 SILICON NANOELECTRONICS WORKSHOP (SNW), pp.65-66 | DOI | |
2019-09 | 2019 INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES (SISPAD 2019), pp.182-184 | DOI | |
2020-06 | 2020 IEEE SILICON NANOELECTRONICS WORKSHOP (SNW), pp.25-26 | DOI | |
2020-06 | 2020 IEEE SILICON NANOELECTRONICS WORKSHOP (SNW), pp.81-82 | DOI | |
2020-06 | 2020 IEEE SYMPOSIUM ON VLSI TECHNOLOGY, p. 9265089 | DOI | |
2020-06 | 2020 IEEE SILICON NANOELECTRONICS WORKSHOP (SNW), pp.99-100 | DOI | |
2020-06 | 2020 IEEE SILICON NANOELECTRONICS WORKSHOP (SNW), pp.95-96 | DOI | |
2021-04 | 2021 5TH IEEE ELECTRON DEVICES TECHNOLOGY & MANUFACTURING CONFERENCE (EDTM) | DOI | |
2021-06 | 2021 SILICON NANOELECTRONICS WORKSHOP (SNW), pp.67-68 | DOI | |
2021-06 | 2021 SILICON NANOELECTRONICS WORKSHOP (SNW), pp.29-30 | DOI | |
2021-08 | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, Vol.21 No.4, pp.241-246 | DOI | |
2022-01 | IEEE Electron Device Letters, Vol.43 No.1, pp.142-145 | DOI | |
2022-01 | Applied Physics Letters, Vol.120 No.1, p. 012901 | DOI | |
2022-01 | Applied Surface Science, Vol.573, p. 151566 | DOI | |
2022-04 | IEEE Electron Device Letters, Vol.43 No.4, pp.549-552 | DOI | |
2022-04 | Semiconductor Science and Technology, Vol.37 No.4, p. 045001 | DOI | |
2022-05 | 2022 5TH INTERNATIONAL CONFERENCE ON CIRCUITS, SYSTEMS AND SIMULATION (ICCSS 2022), pp.135-140 | DOI | |
2022-05 | IEEE Electron Device Letters, Vol.43 No.5, pp.713-716 | DOI | |
2022-06 | IEEE Transactions on Electron Devices, Vol.69 No.6, pp.3151-3157 | DOI | |
2022-06 | IEEE Electron Device Letters, Vol.43 No.6, pp.958-961 | DOI | |
2022-07 | Semiconductor Science and Technology, Vol.37 No.7, p. 075002 | DOI | |
2022-07 | Nanoscale Research Letters, Vol.17 No.1, p. 63 | DOI | |
2022-07 | IEEE Electron Device Letters, Vol.43 No.7, pp.1001-1004 | DOI | |
2022-07 | Nanoscale Research Letters,17(1):63 | view filelink | |
2022-09 | Advanced Intelligent Systems, Vol.4 No.9, p. 2100273 | DOI | |
2022-09 | Sensors and Actuators, B: Chemical, Vol.367, p. 132052 | DOI | |
2022-10 | Nanotechnology, Vol.33 No.43, p. ac805d | DOI | |
2022-10 | Solid-State Electronics, Vol.196, p. 108407 | DOI | |
IEEE Transactions on Electron Devices | DOI |